Dataray光束质量分析，光斑分析，M2光束分析系统

美国 DataRay 公司提供激光光束分析仪器，对激光光束的光斑大小，形状和能量分布等参数进行全面的测试和分析；同时与个人电脑连接对分析的结果提供二维或三维的显示，并对分析的结果进行打印输出。适合各种各样的激光光束，帮助你对你的激光光束的品质提供一个量化的结果。

产品分为：
相机式光束质量分析仪（CCD式） Beam Profiling Cameras
狭缝扫描式光束质量分析仪 Slit Scan Beam Profilers

查看Dataray光束质量分析仪的选择向导

相机式光束质量分析仪（CCD式）
Beam Profiling Cameras

WinCamD系列

WinCamD-UCD12	WinCamD-UCD15	WinCamD-UCD23
WinCamD-UHR	WinCamD-XHR	WinCamD-FIR-HR
WinCamD-LCM

BladeCam-HR和BladeCam-XHR系列

BladeCam-XHR System-BladeCam-XHR	BladeCam-XHR-1310 System-BladeCam-XHR-1310	BladeCam-XHR-UV System-BladeCam-XHR-UV
BladeCam-XHR System-BladeCam-XHR	BladeCam-XHR-1310 System-BladeCam-XHR-1310	BladeCam-XHR-UV System-BladeCam-XHR-UV

TaperCamD-UCD12和TaperCamD20-15-UCD23系列

TaperCamD-UCD12 System-TaperCamD-UCD12	TaperCamD-UCD12-1310 System-TaperCamD-UCD12-1310	TaperCamD-UCD12-NIR System-TaperCamD-UCD12-NIR
TaperCamD20-15-UCD23 System-TaperCamD20-15-UCD23	TaperCamD20-15-UCD23-1310 System-TaperCamD20-15-UCD23-1310	TaperCamD20-15-UCD23-NIR System-TaperCamD20-15-UCD23-NIR

相机式光束质量分析仪附件

Filters/Samplers/Attenuators	Lenses/Optics	Translation Stages/Hardware
UV/IR Converters	Replacement Detectors	Replacement Cables
Manuals

狭缝扫描式光束质量分析仪
Slit Scan Beam Profilers

Beam'R2系列

Beam'R2-S System-BR2-Si	Beam'R2-InGaAs System-BR2-IGA	Beam'R2-DD Si/InGaAs (190-1750 nm) System-BR2-DD
Beam'R2-DD Si/InGaAs (190-2300 nm) System-BR2-DD-2300	Beam'R2-DD Si/InGaAs (190-2500 nm) System-BR2-DD-2500

BeamMap2 4XY/3XYKE系列

BeamMap2-4XY-Si System-BMS2-4XY-Si	BeamMap2-4XY-InGaAs System-BMS2-4XY-IGA	BeamMap2-4XY-DD Si/InGaAs System-BMS2-4XY-DD
BeamMap2-3XYKE-Si System-BMS2-3XYKE-Si	BeamMap2-3XYKE-InGaAs System-BMS2-3XYKE-IGA	BeamMap2-3XYKE-DD Si/InGaAs System-BMS2-3XYKE-DD

BeamMap2 ColliMate系列

BeamMap2-CM4-Si System-BMS2-CM4-Si	BeamMap2-CM4-InGaAs> System-BMS2-CM4-IGA	BeamMap2-CM4-DD Si/InGaAs System-BMS2-CM4-DD
BeamMap2-CM3-Si System-BMS2-CM3-Si	BeamMap2-CM3-InGaAs System-BMS2-CM3-IGA	BeamMap2-CM3-DD Si/InGaAs System-BMS2-CM3-DD

BeamScope-P8 系列

BeamScope-P8-Si System-BSC-P8-Si	BeamScope-P8-Ge System-BSC-P8-Ge	BeamScope-P8-InAs System-BSC-P8-IA
BeamScope-P8-Si, extended probe head System-BSC-P8-Si-EPH	BeamScope-P8-Ge, extended probe head System-BSC-P8-Ge-EPH	BeamScope-P8-InAs, extended probe head System-BSC-P8-IA-EPH

狭缝扫描式光束质量分析仪附件

Samplers/Attenuators	Lenses/Optics>	Translation Stages/Hardware
BeamScope Slits/Pinholes	True2D Sapphire Slits	Replacement Cables
Manuals